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ProbeStar Version 4.2.0 Released!

September 2nd, 2011 | Posted by ssheades in 2010 - (Kommentare deaktiviert für ProbeStar Version 4.2.0 Released!)
  • Extended statistical reporting is now available.
  • Work Order based testing and reporting is now available.
  • The user is now able to manually define special Kelvin or Resistor based tests between selected test locations.
  • The Acceler8 Test File generation has been extended to include MNF file import.

FourStars-ES announces the general release of it’s ProbeStar Test Software!

August 31st, 2010 | Posted by ssheades in 2010 - (Kommentare deaktiviert für FourStars-ES announces the general release of it’s ProbeStar Test Software!)

The ProbeStar Test Software is a completely redesigned control software designed for the
Evolution-2 Test Systems and can also be used to drive the existing Loc8 test systems
previously distributed by the former Mania Technologie AG.

For more information please refer to the ProbeStar Software page.

Four Stars ES announces an agreement with Gardien Europe GmbH!

August 30th, 2010 | Posted by ssheades in 2010 - (Kommentare deaktiviert für Four Stars ES announces an agreement with Gardien Europe GmbH!)

FourStars-ES announces an agreement with Gardien Europe GmbH to provisionally transfer the Maintenance and Service rights for the Evolution-2 Test System from Four Stars-ES to Gardien Europe GmbH.  Four Stars-ES was previously awarded rights for Maintenance and Service within Europe (excluding Spain, Portugal and Italy) by CJ Salvitech, SL.

First 4WK Test in Evolution Flying Probe Tester!

Juli 19th, 2010 | Posted by bdriller in 2010 - (Kommentare deaktiviert für First 4WK Test in Evolution Flying Probe Tester!)
  • The first technical and strategic meeting between the partners Micronic, Salvitech and FourStars-ES was held in May 2010 in Spain at CJ Salvitech S.L.
  • FourStars-ES’s UMD (Universal Measuring Device) was successfully integrated into the Evolution Flying Probe Test System performing 4WK (Four Wire Kelvin) low resistance measurements on real PCBs.